基于CGSPN的復(fù)雜電子系統(tǒng)測試性參數(shù)確定方法

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關(guān)鍵詞：電子系統(tǒng)；測試性參數(shù)；著色廣義隨機(jī)Petri網(wǎng)；共因故障；故障并發(fā) 中圖分類號(hào)：TP206；TH702 文獻(xiàn)標(biāo)志碼：A DOI：10.12305/j.issn.1001-506X.2025.05.15

Abstract：Due to theextensive use of distributed，integrated，and modular solutions，complex electronic systems are prone to new issues such as common-cause failures and fault concurrency，which are diffcult to address using traditional methods for determining testability parameters.To address the above isue，a novel method for determining testability parameters for complex electronic systems based on colored generalized stochastic Petri nets （CGSPN） is proposed. Firstly，by incorporating requirements such asdemand information， constraint boundaries，and maintenance support，a two-level CGSPN model for electronic systems is established.Coloring is introduced to enable real-time tracking of various states of different modules and to handle fault concurrency，while generalized stochastic processing addresses the randomness of common-cause failures.Secondly，a testability parameter processng method incorporating redundancy design is explored throughcoloring andavailability，whichenriches the testability system.Finally，a parallel analysis technique integrating diferent modules and various states is developed，unifying the state transition relationships between system and module levels，and avoiding stage-wise serial processing and equivalent replacement. An example analysis of communication navigation identification （CNI） system demonstrates that the proposed method offers better usability and effectiveness compared to traditional approaches.

Keywords：electronic systems；testability parameters；colored generalized stochastic Petri nets（CGSPN）; common-cause failures；fault concurrency

0 引言

現(xiàn)代電子系統(tǒng)已發(fā)展為高度分布式管理和集中控制的分布式綜合模塊化電子架構(gòu)，這種架構(gòu)能夠支持處理資源和硬件模塊的分布式部署，并實(shí)現(xiàn)高精度的網(wǎng)絡(luò)同步與并行處理，從而顯著增強(qiáng)硬件的靈活性，以及各功能區(qū)域之間的互連、互通和互操作性[1-6]。（剩余17778字）